Studies on the thermal cycling reliability of fine pitch Cu/SnAg double-bump flip chip assemblies on organic substrates: Experimental results and numerical analysis

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Issue Date
2008-12-09
Language
ENG
Citation

10th Electronics Packaging Technology Conference, EPTC 2008, pp.716 - 724

URI
http://hdl.handle.net/10203/157338
Appears in Collection
ME-Conference Papers(학술회의논문)
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