DC Field | Value | Language |
---|---|---|
dc.contributor.author | Joo W.-D. | ko |
dc.contributor.author | You J. | ko |
dc.contributor.author | Ghim Y.-S. | ko |
dc.contributor.author | Kim, Seung-Woo | ko |
dc.date.accessioned | 2013-03-26T01:38:32Z | - |
dc.date.available | 2013-03-26T01:38:32Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-08-11 | - |
dc.identifier.citation | Interferometry XIV: Techniques and Analysis | - |
dc.identifier.uri | http://hdl.handle.net/10203/156833 | - |
dc.language | English | - |
dc.publisher | 123 | - |
dc.title | Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures | - |
dc.type | Conference | - |
dc.identifier.wosid | 000262082100025 | - |
dc.identifier.scopusid | 2-s2.0-52249118096 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | Interferometry XIV: Techniques and Analysis | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | San Diego, CA | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Joo W.-D. | - |
dc.contributor.nonIdAuthor | You J. | - |
dc.contributor.nonIdAuthor | Ghim Y.-S. | - |
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