DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee S.-Y. | - |
dc.contributor.author | Kang M.-G. | - |
dc.contributor.author | Kim, Seung-Woo | - |
dc.date.accessioned | 2013-03-26T01:11:09Z | - |
dc.date.available | 2013-03-26T01:11:09Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-06-18 | - |
dc.identifier.citation | Optical Measurement Systems for Industrial Inspection V, v., no.PART 1, pp.180 - 183 | - |
dc.identifier.uri | http://hdl.handle.net/10203/156656 | - |
dc.language | ENG | - |
dc.title | Grating projection moire interferometry for high speed 3-D inspection of meso-scale objects | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-36248937771 | - |
dc.type.rims | CONF | - |
dc.citation.issue | PART 1 | - |
dc.citation.beginningpage | 180 | - |
dc.citation.endingpage | 183 | - |
dc.citation.publicationname | Optical Measurement Systems for Industrial Inspection V | - |
dc.identifier.conferencecountry | Italy | - |
dc.identifier.conferencecountry | Italy | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Lee S.-Y. | - |
dc.contributor.nonIdAuthor | Kang M.-G. | - |
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