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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

The effects of Ge composition and Si cap thickness on hot carrier reliability of Si/Sil-xGex/Si p-MOSFETs with high-K/metal gate

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Loh, W.-Y. / Majhi, P. / Lee, S.-H. / Oh, J.-W. / Sassman, B. / Young, C. / Bersuker, G. / Cho, Byung Jinresearcher / Park, C.-S. / Kang, C.-Y. / Kirsch, P. / Lee, B.-H. / Harris, H.R. / Tseng, H.-H. / Jammy, R.
Issue Date
2008-06-17
Language
ENG
Citation

2008 Symposium on VLSI Technology Digest of Technical Papers, VLSIT, pp.56 - 57

ISSN
0743-1562
URI
http://hdl.handle.net/10203/155953
Appears in Collection
EE-Conference Papers(학술회의논문)
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