Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers
- Issue Date
- 2009-06-15
- Language
- ENG
- Citation
Optical Measurement Systems for Industrial Inspection VI, v.7389
- ISSN
- 0277-786X
- Appears in Collection
- RIMS Conference Papers
- Files in This Item
- There are no files associated with this item.
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