Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim J.W. | - |
| dc.contributor.author | Kim J.-A. | - |
| dc.contributor.author | Jang R. | - |
| dc.contributor.author | Kang C.-S. | - |
| dc.date.accessioned | 2013-03-18T23:27:31Z | - |
| dc.date.available | 2013-03-18T23:27:31Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-06-15 | - |
| dc.identifier.citation | Optical Measurement Systems for Industrial Inspection VI, v.7389, no., pp. - | - |
| dc.identifier.issn | 0277-786X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/153591 | - |
| dc.language | ENG | - |
| dc.title | Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-69949157009 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 7389 | - |
| dc.citation.publicationname | Optical Measurement Systems for Industrial Inspection VI | - |
| dc.identifier.conferencecountry | Germany | - |
| dc.identifier.conferencecountry | Germany | - |
| dc.contributor.localauthor | Jang R. | - |
| dc.contributor.nonIdAuthor | Kim J.W. | - |
| dc.contributor.nonIdAuthor | Kim J.-A. | - |
| dc.contributor.nonIdAuthor | Kang C.-S. | - |
- Appears in Collection
- RIMS Conference Papers
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.