DSpace at KOASAS: EXAFS analysis and electronic structure of hafnium oxynitride thin films for phase shift

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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

EXAFS analysis and electronic structure of hafnium oxynitride thin films for phase shift

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No, Kwangsoo researcher / Kim, Sung Kwan / Kim, Yang-Soo / Jeon, Young-Ah

Publisher: nternational Conference on Electroceramics 2005 (ICE2005)

Issue Date: 2005-06-14

Language: ENG

Citation: International Conference on Electroceramics 2005 (ICE2005), v.0, no.0, pp.0 - 0

URI: http://hdl.handle.net/10203/150777

Appears in Collection: MS-Conference Papers(학술회의논문)

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