DC Field | Value | Language |
---|---|---|
dc.contributor.author | No, Kwangsoo | - |
dc.contributor.author | Kim, Sung Kwan | - |
dc.contributor.author | Kim, Yang-Soo | - |
dc.contributor.author | Jeon, Young-Ah | - |
dc.date.accessioned | 2013-03-18T17:33:52Z | - |
dc.date.available | 2013-03-18T17:33:52Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-06-14 | - |
dc.identifier.citation | International Conference on Electroceramics 2005 (ICE2005), v.0, no.0, pp.0 - 0 | - |
dc.identifier.uri | http://hdl.handle.net/10203/150777 | - |
dc.language | ENG | - |
dc.publisher | nternational Conference on Electroceramics 2005 (ICE2005) | - |
dc.title | EXAFS analysis and electronic structure of hafnium oxynitride thin films for phase shift | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.volume | 0 | - |
dc.citation.issue | 0 | - |
dc.citation.beginningpage | 0 | - |
dc.citation.endingpage | 0 | - |
dc.citation.publicationname | International Conference on Electroceramics 2005 (ICE2005) | - |
dc.identifier.conferencecountry | Germany | - |
dc.identifier.conferencecountry | Germany | - |
dc.contributor.localauthor | No, Kwangsoo | - |
dc.contributor.nonIdAuthor | Kim, Sung Kwan | - |
dc.contributor.nonIdAuthor | Kim, Yang-Soo | - |
dc.contributor.nonIdAuthor | Jeon, Young-Ah | - |
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