The estimation of the crystalline behavior and electrical property of nominal-composition Ge2Sb2Te5 thin films for phase change random access memory

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Issue Date
2005
Language
ENG
Citation

2005 GIST/KAIST/Kyoto University/Tohoku University Joint Symposium on Advanced Materials

URI
http://hdl.handle.net/10203/147708
Appears in Collection
MS-Conference Papers(학술회의논문)
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