Spectroscopic Ellipsometric Analysis to Investigate A Modification of p-a-SiC:H Ultrathin Film after Ultraviolet Treatment at The Argon Ambient
- Issue Date
- 2003-01-01
- Language
- ENG
- Citation
The 3rd International Conference on Spectroscopic Ellipsometry, pp.0 - 0
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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