Spectroscopic Ellipsometric Analysis to Investigate A Modification of p-a-SiC:H Ultrathin Film after Ultraviolet Treatment at The Argon Ambient
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lim, Koeng Su | - |
| dc.date.accessioned | 2013-03-18T03:48:18Z | - |
| dc.date.available | 2013-03-18T03:48:18Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2003-01-01 | - |
| dc.identifier.citation | The 3rd International Conference on Spectroscopic Ellipsometry, v., no., pp.0 - 0 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/144480 | - |
| dc.language | ENG | - |
| dc.title | Spectroscopic Ellipsometric Analysis to Investigate A Modification of p-a-SiC:H Ultrathin Film after Ultraviolet Treatment at The Argon Ambient | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 0 | - |
| dc.citation.endingpage | 0 | - |
| dc.citation.publicationname | The 3rd International Conference on Spectroscopic Ellipsometry | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Lim, Koeng Su | - |
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