DC Field | Value | Language |
---|---|---|
dc.contributor.author | Koh K.C. | - |
dc.contributor.author | Ko K.W. | - |
dc.contributor.author | Choi B.-W. | - |
dc.contributor.author | Kim J.H. | - |
dc.contributor.author | Cho, Hyungsuck | - |
dc.date.accessioned | 2013-03-18T01:37:06Z | - |
dc.date.available | 2013-03-18T01:37:06Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-10-26 | - |
dc.identifier.citation | Machine Vision and its Optomechatronic Applications, v.5603, no., pp.208 - 214 | - |
dc.identifier.uri | http://hdl.handle.net/10203/143650 | - |
dc.language | ENG | - |
dc.title | An automatic inspection of SMT rectangular chips based on PCA algorithm | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-17644391736 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 5603 | - |
dc.citation.beginningpage | 208 | - |
dc.citation.endingpage | 214 | - |
dc.citation.publicationname | Machine Vision and its Optomechatronic Applications | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Cho, Hyungsuck | - |
dc.contributor.nonIdAuthor | Koh K.C. | - |
dc.contributor.nonIdAuthor | Ko K.W. | - |
dc.contributor.nonIdAuthor | Choi B.-W. | - |
dc.contributor.nonIdAuthor | Kim J.H. | - |
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