DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee D.-Y. | ko |
dc.contributor.author | Gweon, Dae-Gab | ko |
dc.date.accessioned | 2013-03-18T01:26:53Z | - |
dc.date.available | 2013-03-18T01:26:53Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-09-26 | - |
dc.identifier.citation | Key Engineering Materials, pp.401 - 404 | - |
dc.identifier.uri | http://hdl.handle.net/10203/143576 | - |
dc.language | English | - |
dc.publisher | 123 | - |
dc.title | Design and orthogonality correction of a planar scanner for an atomic force microscope | - |
dc.type | Conference | - |
dc.identifier.wosid | 000243448200099 | - |
dc.identifier.scopusid | 2-s2.0-33751549560 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 401 | - |
dc.citation.endingpage | 404 | - |
dc.citation.publicationname | Key Engineering Materials | - |
dc.identifier.conferencecountry | JA | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Lee D.-Y. | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.