Integration of Dual Metal Gate/High-K dielectric Stacks for Fermi-Level Pinning FreeIntegration of Dual Metal Gate/High-K dielectric Stacks for Fermi-Level Pinning Free

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dc.contributor.authorCho, Byung Jin-
dc.date.accessioned2013-03-18T00:50:11Z-
dc.date.available2013-03-18T00:50:11Z-
dc.date.created2012-02-06-
dc.date.issued2005-06-02-
dc.identifier.citationThe 2nd International Workshop on Nanoscale Semiconductor Devices, v., no., pp.253 - 279-
dc.identifier.urihttp://hdl.handle.net/10203/143322-
dc.languageENG-
dc.titleIntegration of Dual Metal Gate/High-K dielectric Stacks for Fermi-Level Pinning Free-
dc.title.alternativeIntegration of Dual Metal Gate/High-K dielectric Stacks for Fermi-Level Pinning Free-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage253-
dc.citation.endingpage279-
dc.citation.publicationnameThe 2nd International Workshop on Nanoscale Semiconductor Devices-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorCho, Byung Jin-
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EE-Conference Papers(학술회의논문)
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