Absolute distance measurement using femtosecond laser
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | - |
| dc.contributor.author | Joo K.-N. | - |
| dc.contributor.author | Jin J. | - |
| dc.contributor.author | Kim Y.S. | - |
| dc.date.accessioned | 2013-03-17T10:38:55Z | - |
| dc.date.available | 2013-03-17T10:38:55Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-06-16 | - |
| dc.identifier.citation | Nano- and Micro-Metrology, v.5858, no., pp.1 - 8 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/142476 | - |
| dc.language | ENG | - |
| dc.title | Absolute distance measurement using femtosecond laser | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-28844507591 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 5858 | - |
| dc.citation.beginningpage | 1 | - |
| dc.citation.endingpage | 8 | - |
| dc.citation.publicationname | Nano- and Micro-Metrology | - |
| dc.identifier.conferencecountry | Germany | - |
| dc.identifier.conferencecountry | Germany | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Joo K.-N. | - |
| dc.contributor.nonIdAuthor | Jin J. | - |
| dc.contributor.nonIdAuthor | Kim Y.S. | - |
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