Evaluation of Notch Tip Strains using Whole Field Optical Measurement Technigues

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dc.contributor.authorYang, Se Young-
dc.contributor.authorLim, Jae-Yong-
dc.contributor.authorLee, Soon-Bok-
dc.date.accessioned2013-03-17T03:24:19Z-
dc.date.available2013-03-17T03:24:19Z-
dc.date.created2012-02-06-
dc.date.issued2003-09-
dc.identifier.citationATEM'03, v., no., pp.OS01W - 308-
dc.identifier.urihttp://hdl.handle.net/10203/139372-
dc.languageENG-
dc.titleEvaluation of Notch Tip Strains using Whole Field Optical Measurement Technigues-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpageOS01W-
dc.citation.endingpage308-
dc.citation.publicationnameATEM'03-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorLee, Soon-Bok-
dc.contributor.nonIdAuthorYang, Se Young-
dc.contributor.nonIdAuthorLim, Jae-Yong-
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ME-Conference Papers(학술회의논문)
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