Micro-motion measurement system for milli-structure using diffraction grating

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dc.contributor.authorBae E.W.ko
dc.contributor.authorKim J.-A.ko
dc.contributor.authorKim S.H.ko
dc.contributor.authorKwak, Yoon Keunko
dc.date.accessioned2013-03-16T21:31:21Z-
dc.date.available2013-03-16T21:31:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-11-05-
dc.identifier.citationOptomechatronic Systems, pp.71 - 79-
dc.identifier.urihttp://hdl.handle.net/10203/136094-
dc.languageEnglish-
dc.publisherSPIE-
dc.titleMicro-motion measurement system for milli-structure using diffraction grating-
dc.typeConference-
dc.identifier.wosid000169001400008-
dc.identifier.scopusid2-s2.0-0035010188-
dc.type.rimsCONF-
dc.citation.beginningpage71-
dc.citation.endingpage79-
dc.citation.publicationnameOptomechatronic Systems-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationBoston, MA-
dc.contributor.localauthorKwak, Yoon Keun-
dc.contributor.nonIdAuthorBae E.W.-
dc.contributor.nonIdAuthorKim J.-A.-
dc.contributor.nonIdAuthorKim S.H.-
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ME-Conference Papers(학술회의논문)
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