DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bae E.W. | ko |
dc.contributor.author | Kim J.-A. | ko |
dc.contributor.author | Kim S.H. | ko |
dc.contributor.author | Kwak, Yoon Keun | ko |
dc.date.accessioned | 2013-03-16T21:31:21Z | - |
dc.date.available | 2013-03-16T21:31:21Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2000-11-05 | - |
dc.identifier.citation | Optomechatronic Systems, pp.71 - 79 | - |
dc.identifier.uri | http://hdl.handle.net/10203/136094 | - |
dc.language | English | - |
dc.publisher | SPIE | - |
dc.title | Micro-motion measurement system for milli-structure using diffraction grating | - |
dc.type | Conference | - |
dc.identifier.wosid | 000169001400008 | - |
dc.identifier.scopusid | 2-s2.0-0035010188 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 71 | - |
dc.citation.endingpage | 79 | - |
dc.citation.publicationname | Optomechatronic Systems | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Boston, MA | - |
dc.contributor.localauthor | Kwak, Yoon Keun | - |
dc.contributor.nonIdAuthor | Bae E.W. | - |
dc.contributor.nonIdAuthor | Kim J.-A. | - |
dc.contributor.nonIdAuthor | Kim S.H. | - |
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