DC Field | Value | Language |
---|---|---|
dc.contributor.author | 엄윤용 | - |
dc.date.accessioned | 2013-03-16T18:26:01Z | - |
dc.date.available | 2013-03-16T18:26:01Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2001 | - |
dc.identifier.citation | 대한기계학회 춘계학술대회, v., no., pp.298 - 303 | - |
dc.identifier.uri | http://hdl.handle.net/10203/134320 | - |
dc.language | KOR | - |
dc.title | Study on Misfit Dislocations and Critical Thickness in a SixGe1-x Epitaxial Film on a Si Substrate | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 298 | - |
dc.citation.endingpage | 303 | - |
dc.citation.publicationname | 대한기계학회 춘계학술대회 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | 엄윤용 | - |
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