Experimental Approaches for Solder Joint Relaibility
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Soon-Bok | - |
| dc.contributor.author | Ham, SJ | - |
| dc.contributor.author | Park, TS | - |
| dc.date.accessioned | 2013-03-16T10:14:00Z | - |
| dc.date.available | 2013-03-16T10:14:00Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002-01-01 | - |
| dc.identifier.citation | SEMICON Korea Technical Sysmposium 2002, v., no., pp.79 - 85 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/130217 | - |
| dc.language | ENG | - |
| dc.title | Experimental Approaches for Solder Joint Relaibility | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 79 | - |
| dc.citation.endingpage | 85 | - |
| dc.citation.publicationname | SEMICON Korea Technical Sysmposium 2002 | - |
| dc.contributor.localauthor | Lee, Soon-Bok | - |
| dc.contributor.nonIdAuthor | Ham, SJ | - |
| dc.contributor.nonIdAuthor | Park, TS | - |
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