Very Large Scale Phase Measuring Interferometry of Work Surfaces for Diagnostic Analysis of the Diamond Turning Process
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.contributor.author | Kim, D.S. | ko |
| dc.contributor.author | Chang, I.C. | ko |
| dc.contributor.author | Keem, T.H. | ko |
| dc.contributor.author | Yoo, S.B. | ko |
| dc.date.accessioned | 2013-03-16T10:06:58Z | - |
| dc.date.available | 2013-03-16T10:06:58Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-05 | - |
| dc.identifier.citation | Proc. of 1st International Conference of the European Society for Precision Engineering and Nanotech, pp.24 - 27 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/130168 | - |
| dc.language | English | - |
| dc.publisher | European-Society-for-Precision-Engineering and Nanotechnology | - |
| dc.title | Very Large Scale Phase Measuring Interferometry of Work Surfaces for Diagnostic Analysis of the Diamond Turning Process | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000222984000003 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 24 | - |
| dc.citation.endingpage | 27 | - |
| dc.citation.publicationname | Proc. of 1st International Conference of the European Society for Precision Engineering and Nanotech | - |
| dc.identifier.conferencecountry | US | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Kim, D.S. | - |
| dc.contributor.nonIdAuthor | Chang, I.C. | - |
| dc.contributor.nonIdAuthor | Keem, T.H. | - |
| dc.contributor.nonIdAuthor | Yoo, S.B. | - |
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