Showing results 3941 to 3960 of 12232
Equations of exposure time and X-ray mask absorber thickness in the LIGA process Gil, KH; Lee, Seung Seob; Youm, Y, MICROSYSTEM TECHNOLOGIES, v.7, no.1, pp.1 - 5, 2001-03 |
Equivalence between enhanced assumed strain method and assumed stress hybrid method based on the Hellinger-Reissner principle Yeo, ST; Lee, Byung Chai, INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING, v.39, no.18, pp.3083 - 3099, 1996-09 |
Equivalence between two solvability conditions for a static output feedback problem Kim, Kyung-Soo; Park, Youngjin, IEEE TRANSACTIONS ON AUTOMATIC CONTROL, v.45, no.10, pp.1877 - 1877, 2000-10 |
Equivalent target probability of failure to convert high-reliability model to low-reliability model for efficiency of sampling-based RBDO Lee, Ikjin; Shin, Jaekwan; Choi, K. K., STRUCTURAL AND MULTIDISCIPLINARY OPTIMIZATION, v.48, no.2, pp.235 - 248, 2013-08 |
Er-doped fiber comb with enhanced f(ceo) S/N ratio using Tm:Ho-doped fiber Kim, Yun-Seok; KIM, Young-Jin; Kim, Seung-Man; Kim, Seung-Woo, OPTICS EXPRESS, v.17, no.21, pp.18606 - 18611, 2009-10 |
Er-doped fiber frequency comb with mHz relative linewidth Kim, Yun-Seok; Kim, Seung-Man; KIM, Young-Jin; Hussein, Hatem; Kim, Seung-Woo, OPTICS EXPRESS, v.17, no.14, pp.11972 - 11977, 2009-07 |
Erbium-doped and Raman microlasers on a silicon chip fabricated by the sol-gel process Yang, L; Carmon, T; Min, Bumki; Spillane, SM; Vahala, KJ, APPLIED PHYSICS LETTERS, v.86, no.9, 2005-02 |
Erbium-implanted high-Q silica toroidal microcavity laser on a silicon chip Min, Bumki; Kippenberg, TJ; Yang, L; Vahala, KJ; Kalkman, J; Polman, A, PHYSICAL REVIEW A, v.70, no.3, 2004-09 |
Error analysis of a flexure hinge mechanism induced by machining imperfection Ryu, JW; Gweon, Dae-Gab, PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, v.21, no.2-3, pp.83 - 89, 1997 |
ERROR ANALYSIS OF INDIRECT FORCE DETERMINATION AND A REGULARIZATION METHOD TO REDUCE FORCE DETERMINATION ERROR LEE, Hyuk; Park, Youn-sik, MECHANICAL SYSTEMS AND SIGNAL PROCESSING, v.9, no.6, pp.615 - 633, 1995-11 |
Error analysis of spectral remote sensing by CO2 4.3 μ m band in various temperature profiles Yang S.S.; Song, Tae-Ho, JOURNAL OF QUANTITATIVE SPECTROSCOPY AND RADIATIVE TRANSFER, v.66, no.4, pp.327 - 341, 2000-08 |
Error estimation for the automated multi-level substructuring method Boo, Seung-Hwan; Kim, Jin-Gyun; Lee, Phill-Seung, INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING, v.106, no.11, pp.927 - 950, 2016-06 |
Error-lumped inverse uncertainty quantification of automotive heat exchangers (HEXs) using large-scale database from system level tests Pae, Seongmin; Jo, Hwisang; Lee, Ikjin, STRUCTURAL AND MULTIDISCIPLINARY OPTIMIZATION, v.64, no.4, pp.2709 - 2724, 2021-10 |
Errors due to sensor and position mismatch in planar acoustic holography Nam, KU; Kim, Yang-Hann, JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, v.106, no.4, pp.1655 - 1665, 1999-10 |
Errors of the dynamically tuned strapdown gyroscope to constant and harmonic rate inputs Lee, SK; Lee, Chong-Won, PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART C-JOURNAL OF MECHANICAL ENGINEERING SCIENCE, v.211, no.8, pp.627 - 637, 1997 |
Eshelby twist and correlation effects in diffraction from nanocrystals Leonardi, A.; Ryu, Seunghwa; Pugno, N. M.; Scardi, P., JOURNAL OF APPLIED PHYSICS, v.117, no.16, 2015-04 |
Establishment of KRISS watt balance system to have high uniformity performance Kim, MyeongHyeon; Kim, Dongmin; Woo, Byung-Chill; Ha, Dokyeong; Lee, Sung-Uk; Park, Hyung-Soon; Kim, Jinhee; et al, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.18, no.7, pp.945 - 953, 2017-07 |
Ester-functionalized, wide-bandgap derivatives of PM7 for simultaneous enhancement of photovoltaic performance and mechanical robustness of all-polymer solar cells You, Hoseon; Jones, Austin L.; Ma, Boo Soo; Kim, Geon-U; Lee, Seungjin; Lee, Jin-Woo; Kang, Hyunbum; et al, JOURNAL OF MATERIALS CHEMISTRY A, v.9, no.5, pp.2775 - 2783, 2021-02 |
Estimating Clothing Thermal Insulation Using an Infrared Camera Lee, Jeong Hoon; Kim, Young-Keun; Kim, Kyung-Soo; Kim, Soohyun, SENSORS, v.16, no.3, 2016-03 |
Estimating relative eigenvalue errors in the Craig-Bampton method Kim, Jin Gyun; Lee, Kang Heon; Lee, PhillSeung, COMPUTERS & STRUCTURES, v.139, pp.54 - 64, 2014-07 |
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