Eshelby twist and correlation effects in diffraction from nanocrystals

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Molecular dynamics simulations were used to model the Eshelby dislocation inside Pd and Ir nanowires and to predict the powder diffraction pattern using the Debye scattering equation. We find that the ideal dislocation solution by Eshelby is in good agreement with the observed twist angle and deviatoric strain, even though it ignores both the splitting of the Eshelby dislocation into two partials and surface stress. Surface stress plays a significant role only for nanorods with small aspect ratio (similar to 1:1). We also find that Wilson's prediction on the diffraction peak broadening for the Eshelby dislocation is overestimated because it ignores the fact that the Eshelby twist relaxes the deviatoric strain. Moreover, the twist loosens the correlation along the nanorod, causing additional line profile broadening, which is read by diffraction as a decrease of coherent domain size when the total twist angle is bigger than 1.5 degrees. Overall, our findings suggest a novel way to predict and analyze the dislocations as well as the resulting strain fields in the twisted nanocrystalline rods.
Publisher
AMER INST PHYSICS
Issue Date
2015-04
Language
English
Article Type
Article
Keywords

EMBEDDED-ATOM-METHOD; X-RAY; CRYSTALS; DEFECTS; GROWTH; METALS; STRAIN

Citation

JOURNAL OF APPLIED PHYSICS, v.117, no.16

ISSN
0021-8979
DOI
10.1063/1.4918918
URI
http://hdl.handle.net/10203/198719
Appears in Collection
ME-Journal Papers(저널논문)
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