Showing results 1 to 2 of 2
785-nm Frequency Comb-Based Time-of-Flight Detection for 3D Surface Profilometry of Silicon Devices Kwak, Hyunsoo; Ahn, Changmin; Na, Yongjin; Bae, Jinho; Kim, Jungwon, IEEE PHOTONICS JOURNAL, v.14, no.5, 2022-10 |
Dynamic absolute distance measurement with nanometer-precision and MHz acquisition rate using a frequency comb-based combined method Ahn, Changmin; Na, Yongjin; Kim, Jungwon, OPTICS AND LASERS IN ENGINEERING, v.162, 2023-03 |
Discover