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Showing results 1 to 5 of 5

1
Direct spectral phase function calculation for dispersive interferometric thickness profilometry

Kim, D; Kim, Soohyun, OPTICS EXPRESS, v.12, pp.5117 - 5124, 2004-10

2
High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometer

You, Jang-Woo; Kim, Soohyun; Kim, Daesuk, OPTICS EXPRESS, v.16, no.25, pp.21022 - 21031, 2008-12

3
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer

You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02

4
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate

Debnath, Sanjit K.; Kim, Seung-Woo; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12

5
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry

Ghim, Young-Sik; Kim, Seung-Woo, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11

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