Showing results 3 to 5 of 5
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02 |
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate Debnath, Sanjit K.; Kim, Seung-Woo; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12 |
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry Ghim, Young-Sik; Kim, Seung-Woo, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11 |
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