Showing results 10 to 13 of 13
Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry Kim, Seung-Woo; Kim, GH, APPLIED OPTICS, v.38, no.28, pp.5968 - 5973, 1999-10 |
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry Ghim, Young-Sik; Kim, Seung-Woo, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11 |
Time-of-flight detection of femtosecond laser pulses for precise measurement of large microelectronic step height Lu, Xing; Zhang, Shuangyou; Jeon, Chan-Gi; Kang, Chu-Shik; Kim, Jungwon; Shi, Kebin, OPTICS LETTERS, v.43, no.7, pp.1447 - 1450, 2018-04 |
White light on-axis digital holographic microscopy based on spectral phase shifting Kim, D; You, JW; Kim, Soohyun, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01 |
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