The Measurement of Mechanical Properties for Nickel Thin Film
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, TS | - |
| dc.contributor.author | Baek, DC | - |
| dc.contributor.author | Lee, Soon-Bok | - |
| dc.contributor.author | Na, KH | - |
| dc.date.accessioned | 2013-03-16T05:19:26Z | - |
| dc.date.available | 2013-03-16T05:19:26Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002 | - |
| dc.identifier.citation | Workshop on Development of Micro Optical and Thermofluidic Devices with Functionality, v., no., pp.73 - 78 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/127858 | - |
| dc.language | KOR | - |
| dc.title | The Measurement of Mechanical Properties for Nickel Thin Film | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 73 | - |
| dc.citation.endingpage | 78 | - |
| dc.citation.publicationname | Workshop on Development of Micro Optical and Thermofluidic Devices with Functionality | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Lee, Soon-Bok | - |
| dc.contributor.nonIdAuthor | Park, TS | - |
| dc.contributor.nonIdAuthor | Baek, DC | - |
| dc.contributor.nonIdAuthor | Na, KH | - |
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