SYSTEM RELIABILITY IN THE PRESENCE OF COMMON-CAUSE FAILURES
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chae, Kyung-Chul | ko |
| dc.contributor.author | CLARK, GM | ko |
| dc.date.accessioned | 2007-09-04T02:50:31Z | - |
| dc.date.available | 2007-09-04T02:50:31Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1986-04 | - |
| dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v.35, no.1, pp.32 - 35 | - |
| dc.identifier.issn | 0018-9529 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/1275 | - |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | SYSTEM RELIABILITY IN THE PRESENCE OF COMMON-CAUSE FAILURES | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1986A581100010 | - |
| dc.identifier.scopusid | 2-s2.0-0022705689 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 35 | - |
| dc.citation.issue | 1 | - |
| dc.citation.beginningpage | 32 | - |
| dc.citation.endingpage | 35 | - |
| dc.citation.publicationname | IEEE TRANSACTIONS ON RELIABILITY | - |
| dc.identifier.doi | 10.1109/TR.1986.4335336 | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Chae, Kyung-Chul | - |
| dc.contributor.nonIdAuthor | CLARK, GM | - |
| dc.type.journalArticle | Article | - |
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