DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, JA | - |
dc.contributor.author | Kim, KC | - |
dc.contributor.author | Kim, Soohyun | - |
dc.contributor.author | Kwak, Yoon Keun | - |
dc.date.accessioned | 2013-03-16T03:41:34Z | - |
dc.date.available | 2013-03-16T03:41:34Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2000 | - |
dc.identifier.citation | Proceedings of SPIE- The International Society for Optical Engineering, v., no., pp.150 - 157 | - |
dc.identifier.uri | http://hdl.handle.net/10203/127107 | - |
dc.language | ENG | - |
dc.title | Multi-degree-of-freedom displacement measurement system using a diffraction grating | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 150 | - |
dc.citation.endingpage | 157 | - |
dc.citation.publicationname | Proceedings of SPIE- The International Society for Optical Engineering | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kim, Soohyun | - |
dc.contributor.localauthor | Kwak, Yoon Keun | - |
dc.contributor.nonIdAuthor | Kim, JA | - |
dc.contributor.nonIdAuthor | Kim, KC | - |
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