DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | - |
dc.contributor.author | Chang In-Chul | - |
dc.contributor.author | Kim Dong-Sik | - |
dc.contributor.author | Kim Tae-Ho | - |
dc.contributor.author | Yoo Seung-Bong | - |
dc.date.accessioned | 2013-03-16T02:21:41Z | - |
dc.date.available | 2013-03-16T02:21:41Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1999-08-30 | - |
dc.identifier.citation | Proceedings of the 1999 Pacific Rim Conference on Lasers and Electro-Optcis (CLEO/PACIFIC Rim '99), v.1, no., pp.70 - 71 | - |
dc.identifier.uri | http://hdl.handle.net/10203/126434 | - |
dc.language | ENG | - |
dc.title | Very large scale phase measuring interferometry for profile measurement of aspheric surfaces with nanometer accuracy | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-0033283763 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 1 | - |
dc.citation.beginningpage | 70 | - |
dc.citation.endingpage | 71 | - |
dc.citation.publicationname | Proceedings of the 1999 Pacific Rim Conference on Lasers and Electro-Optcis (CLEO/PACIFIC Rim '99) | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Chang In-Chul | - |
dc.contributor.nonIdAuthor | Kim Dong-Sik | - |
dc.contributor.nonIdAuthor | Kim Tae-Ho | - |
dc.contributor.nonIdAuthor | Yoo Seung-Bong | - |
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