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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Very large scale phase measuring interferometry for profile measurement of aspheric surfaces with nanometer accuracy

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dc.contributor.authorKim, Seung-Woo-
dc.contributor.authorChang In-Chul-
dc.contributor.authorKim Dong-Sik-
dc.contributor.authorKim Tae-Ho-
dc.contributor.authorYoo Seung-Bong-
dc.date.accessioned2013-03-16T02:21:41Z-
dc.date.available2013-03-16T02:21:41Z-
dc.date.created2012-02-06-
dc.date.issued1999-08-30-
dc.identifier.citationProceedings of the 1999 Pacific Rim Conference on Lasers and Electro-Optcis (CLEO/PACIFIC Rim '99), v.1, no., pp.70 - 71-
dc.identifier.urihttp://hdl.handle.net/10203/126434-
dc.languageENG-
dc.titleVery large scale phase measuring interferometry for profile measurement of aspheric surfaces with nanometer accuracy-
dc.typeConference-
dc.identifier.scopusid2-s2.0-0033283763-
dc.type.rimsCONF-
dc.citation.volume1-
dc.citation.beginningpage70-
dc.citation.endingpage71-
dc.citation.publicationnameProceedings of the 1999 Pacific Rim Conference on Lasers and Electro-Optcis (CLEO/PACIFIC Rim '99)-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorChang In-Chul-
dc.contributor.nonIdAuthorKim Dong-Sik-
dc.contributor.nonIdAuthorKim Tae-Ho-
dc.contributor.nonIdAuthorYoo Seung-Bong-
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ME-Conference Papers(학술회의논문)
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