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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

The effect of annealing temperature on electrical properties of SBT/insulators/Si structure for MFIS in NDRO-type FRAM

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Lee, Hee Chulresearcher
Issue Date
1998-09-01
Language
ENG
Citation

pp.0 - 0

URI
http://hdl.handle.net/10203/120705
Appears in Collection
EE-Conference Papers(학술회의논문)
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