Projection Moire for 3D Inspection of Printed Circuit Boards
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.contributor.author | Choi, YB | ko |
| dc.contributor.author | Oh, JT | ko |
| dc.date.accessioned | 2013-03-15T12:04:40Z | - |
| dc.date.available | 2013-03-15T12:04:40Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997-02 | - |
| dc.identifier.citation | SPIE, pp.129 - 138 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/119305 | - |
| dc.language | English | - |
| dc.publisher | SPIE | - |
| dc.title | Projection Moire for 3D Inspection of Printed Circuit Boards | - |
| dc.type | Conference | - |
| dc.identifier.wosid | A1997BH56Y00013 | - |
| dc.identifier.scopusid | 2-s2.0-85076379662 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 129 | - |
| dc.citation.endingpage | 138 | - |
| dc.citation.publicationname | SPIE | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Jose | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Choi, YB | - |
| dc.contributor.nonIdAuthor | Oh, JT | - |
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