DC Field | Value | Language |
---|---|---|
dc.contributor.author | Stein, J. L | - |
dc.contributor.author | Park, Youngjin | - |
dc.date.accessioned | 2013-03-14T17:05:02Z | - |
dc.date.available | 2013-03-14T17:05:02Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1988 | - |
dc.identifier.citation | American Control Conference, v., no., pp.1924 - 1929 | - |
dc.identifier.uri | http://hdl.handle.net/10203/111065 | - |
dc.language | ENG | - |
dc.title | Modeling and Sensing Issues for Machine Diagnostics | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1924 | - |
dc.citation.endingpage | 1929 | - |
dc.citation.publicationname | American Control Conference | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Park, Youngjin | - |
dc.contributor.nonIdAuthor | Stein, J. L | - |
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