Showing results 1 to 6 of 6
Direct Observation of Contact Electrification Effects at Nanoscale Using Scanning Probe Microscopy Kim, Jong Hun; Jeong, Jinhyeok; Kong, Dae Sol; Yoon, Hongyeon; Cho, Hunyoung; Jung, Jong Hoon; Park, Jeong Young, ADVANCED MATERIALS INTERFACES, v.11, no.6, 2024-02 |
Dopant-Tunable Ultrathin Transparent Conductive Oxides for Efficient Energy Conversion Devices Kang, Dae Yun; Kim, Bo-Hyun; Lee, Tae Ho; Shim, Jae Won; Kim, Sungmin; Sung, Ha-Jun; Chang, Kee Joo; et al, NANO-MICRO LETTERS, v.13, pp.211, 2021-12 |
Effect of O-vacancy defects on the Schottky barrier heights in Ni/SiO2 and Ni/HfO2 interfaces Noh, Hyeon-Kyun; Oh, Young-Jun; Chang, Kee-Joo, PHYSICA B-CONDENSED MATTER, v.407, no.15, pp.2907 - 2910, 2012-08 |
Ferroelastically protected polarization switching pathways to control electrical conductivity in strain-graded ferroelectric nanoplates Kim, Kwang-Eun; Kim, Yong-Jin; Zhang, Yang; Xue, Fei; Kim, Gi-Yeop; Song, Kyung; Choi, Si-Young; et al, PHYSICAL REVIEW MATERIALS, v.2, no.8, pp.084412, 2018-08 |
How Hot Electron Generation at the Solid-Liquid Interface Is Different from the Solid-Gas Interface Lee, Si Woo; Kim, Heeyoung; Park, Jeong Young, NANO LETTERS, v.23, no.11, pp.5373 - 5380, 2023-03 |
Near-atomically flat, chemically homogeneous, electrically conductive optical metasurface Kim, Jong Uk; Jeon, Suwan; Heo, MInsung; Kim, Hwi-Min; Kim, Reehyang; Kim, Nayoung; Lee, Yong-Hee; et al, NANOSCALE, v.11, no.19, pp.9580 - 9586, 2019-05 |
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