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Showing results 1 to 13 of 13

1
4-MIRROR IMAGING-SYSTEM (MAGNIFICATION +1-5) FOR ARF EXCIMER-LASER LITHOGRAPHY

RIM, CS; CHO, YM; Kong, Hong-Jin; LEE, SS, OPTICAL AND QUANTUM ELECTRONICS, v.27, no.5, pp.319 - 325, 1995-05

2
ANALYSIS OF LASER-ASSISTED CHEMICAL ETCHING PROCESSES OF A PINHOLE BY MONITORING DIFFRACTION PATTERNS OF REFLECTED BEAMS

AHN, CN; Lee, Yong-Hee; LEE, SS, APPLIED OPTICS, v.31, no.36, pp.7611 - 7616, 1992-12

3
DUAL WAVELENGTH AND CONTINUOUSLY VARIABLE POLARIZATION DYE-LASER

Kong, Hong-Jin; LEE, SS, IEEE JOURNAL OF QUANTUM ELECTRONICS, v.17, no.4, pp.439 - 441, 1981-04

4
DYE-LASER FREQUENCY LOCKING TO THE HYPERFINE-STRUCTURE (3S1/2, F = 2-3P1/2, F = 2) OF SODIUM D1 LINE BY USING POLARIZATION SPECTROSCOPY

KIM, JB; Kong, Hong-Jin; LEE, SS, APPLIED PHYSICS LETTERS, v.52, no.6, pp.417 - 419, 1988-02

5
GENERATION OF COHERENT UNDULATOR RADIATION USING A RELATIVISTIC PHOTOELECTRON BEAM WITH PICOSECOND MICROPULSES

JEONG, YU; Nam, Chang Hee; LEE, SS; KAWAMURA, Y; TOYODA, K, PHYSICAL REVIEW E, v.47, no.2, pp.1313 - 1320, 1993-02

6
GRAIN-SIZE CONTROL OF BISUBSTITUTED GARNET-FILMS CRYSTALLIZED BY MULTISTEP RAPID THERMAL ANNEALING FOR MAGNETOOPTICAL DISKS

KIM, HS; Lee, Yong-Hee; LEE, SS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.32, no.12B, pp.1804 - 1807, 1993-12

7
IMPROVED 4-MIRROR OPTICAL-SYSTEM FOR DEEP-ULTRAVIOLET SUBMICROMETER LITHOGRAPHY

KIM, JT; Kong, Hong-Jin; LEE, SS, OPTICAL ENGINEERING, v.32, no.3, pp.536 - 541, 1993-03

8
NONLINEAR ABSORPTION OF A TRANSVERSELY EXCITED ATMOSPHERE CO2-LASER BEAM IN CF3 BR MOLECULES AND MEASUREMENT OF THE NONLINEAR REFRACTIVE-INDEX COEFFICIENT

LIM, CM; Kong, Hong-Jin; LEE, SS, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.10, no.8, pp.1360 - 1364, 1993-08

9
OBSERVATION OF COHERENT EFFECT IN UNDULATOR RADIATION

JEONG, YU; KAWAMURA, Y; TOYODA, K; Nam, Chang Hee; LEE, SS, PHYSICAL REVIEW LETTERS, v.68, no.8, pp.1140 - 1143, 1992-02

10
POLARIZATION-MODULATED OPTICAL-PUMPING SPECTROSCOPY OF NAD1 AND D2 LINES

KIM, JS; Kong, Hong-Jin; LEE, SS; KIM, JB, PHYSICAL REVIEW A, v.39, no.4, pp.2236 - 2238, 1989-02

11
SHOT-NOISE-CORRECTED MEASUREMENT OF THE G(2)(0) OF THE SPECKLE BACKSCATTERED FROM A ROTATING RANDOMLY ROUGH METAL-SURFACE

AHN, SJ; Kim, Byoung Yoon; LEE, SS, OPTICS LETTERS, v.17, no.5, pp.317 - 319, 1992-03

12
SIMULTANEOUS MEASUREMENT OF ABSORPTION-LINES FOR RIGHT AND LEFT CIRCULARLY POLARIZED FIELDS USING SATURATION SPECTROSCOPY

KIM, JB; LEE, JM; KIM, JS; Kong, Hong-Jin; LEE, SS, OPTICS LETTERS, v.16, no.7, pp.511 - 513, 1991-04

13
THIN-FILM TRANSISTORS WITH POLYCRYSTALLINE SILICON PREPARED BY A NEW ANNEALING METHOD

NAM, KS; SONG, YH; BAEK, JT; Kong, Hong-Jin; LEE, SS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.32, no.5A, pp.1908 - 1912, 1993-05

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