ANALYSIS OF LASER-ASSISTED CHEMICAL ETCHING PROCESSES OF A PINHOLE BY MONITORING DIFFRACTION PATTERNS OF REFLECTED BEAMS

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The detailed processes of laser-assisted chemical etching are studied by using an optical in situ monitoring method. Various Al thin-film specimens are processed in aqueous H3PO4 solutions by shining focused Ar+ laser beams. As etching progresses, it is observed in the back reflected laser beam that a concentric circular fringe pattern appears and shrinks. The development of the etching process is explained by analyzing the diffraction patterns with an etched shape function of a Gaussian nature.
Publisher
OPTICAL SOC AMER
Issue Date
1992-12
Language
English
Article Type
Article
Keywords

FILMS; DEPOSITION

Citation

APPLIED OPTICS, v.31, no.36, pp.7611 - 7616

ISSN
0003-6935
URI
http://hdl.handle.net/10203/20185
Appears in Collection
PH-Journal Papers(저널논문)
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