Characterization of SrTiO3 thin film by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- Issue Date
- 1992
- Language
- ENG
- Citation
The 94th Annual Meeting of the Am. Ceram. Soc. (U.S.A.)
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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