DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Ho Gi | - |
dc.date.accessioned | 2013-03-14T14:55:27Z | - |
dc.date.available | 2013-03-14T14:55:27Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1992 | - |
dc.identifier.citation | The 94th Annual Meeting of the Am. Ceram. Soc. (U.S.A.), v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/109920 | - |
dc.language | ENG | - |
dc.title | Characterization of SrTiO3 thin film by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The 94th Annual Meeting of the Am. Ceram. Soc. (U.S.A.) | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kim, Ho Gi | - |
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