Study on the Mechanism and Modeling for Super-filling of High-Aspect-Ratio Features with Copper by Catalyst Enhanced Chemical Vapor Deposition Coupled with Plasma Treatment

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The mechanism behind super-filling of high-aspect-ratio features with Cu by catalyst-enhanced chemical vapor deposition (CECVD) coupled with plasma treatment is described and the metrology required to predict the filling feasibility is identified and quantified. The reaction probability of a Cu precursor was, determined as a function of substrate temperature. Iodine adatoms are deactivated by the bombardment of energetic particles and also by the overdeposition of sputtered Cu atoms during the plasma treatment. The degree of deactivation of adsorbed iodine was experimentally quantified. The quantified factors, reaction probability and degree of deactivation of iodine were introduced to the simulation for the prediction of the trench filling aspect by CECVD coupled with plasma treatment. Simulated results show excellent agreement with the experimental filling aspects.
Publisher
KOREAN INST METALS MATERIALS
Issue Date
2011-04
Language
English
Article Type
Article
Keywords

3-DIMENSIONAL CHIP STACKING; CU; TECHNOLOGY

Citation

KOREAN JOURNAL OF METALS AND MATERIALS, v.49, no.4, pp.334 - 341

ISSN
1738-8228
DOI
10.3365/KJMM.2011.49.4.334
URI
http://hdl.handle.net/10203/101505
Appears in Collection
MS-Journal Papers(저널논문)
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