Study on the Mechanism and Modeling for Super-filling of High-Aspect-Ratio Features with Copper by Catalyst Enhanced Chemical Vapor Deposition Coupled with Plasma Treatment

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dc.contributor.authorKim, Chang-Gyuko
dc.contributor.authorLee, Do-Seonko
dc.contributor.authorLee, Won-Jongko
dc.date.accessioned2013-03-12T06:17:45Z-
dc.date.available2013-03-12T06:17:45Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2011-04-
dc.identifier.citationKOREAN JOURNAL OF METALS AND MATERIALS, v.49, no.4, pp.334 - 341-
dc.identifier.issn1738-8228-
dc.identifier.urihttp://hdl.handle.net/10203/101505-
dc.description.abstractThe mechanism behind super-filling of high-aspect-ratio features with Cu by catalyst-enhanced chemical vapor deposition (CECVD) coupled with plasma treatment is described and the metrology required to predict the filling feasibility is identified and quantified. The reaction probability of a Cu precursor was, determined as a function of substrate temperature. Iodine adatoms are deactivated by the bombardment of energetic particles and also by the overdeposition of sputtered Cu atoms during the plasma treatment. The degree of deactivation of adsorbed iodine was experimentally quantified. The quantified factors, reaction probability and degree of deactivation of iodine were introduced to the simulation for the prediction of the trench filling aspect by CECVD coupled with plasma treatment. Simulated results show excellent agreement with the experimental filling aspects.-
dc.languageEnglish-
dc.publisherKOREAN INST METALS MATERIALS-
dc.subject3-DIMENSIONAL CHIP STACKING-
dc.subjectCU-
dc.subjectTECHNOLOGY-
dc.titleStudy on the Mechanism and Modeling for Super-filling of High-Aspect-Ratio Features with Copper by Catalyst Enhanced Chemical Vapor Deposition Coupled with Plasma Treatment-
dc.typeArticle-
dc.identifier.wosid000290777000009-
dc.identifier.scopusid2-s2.0-79957790334-
dc.type.rimsART-
dc.citation.volume49-
dc.citation.issue4-
dc.citation.beginningpage334-
dc.citation.endingpage341-
dc.citation.publicationnameKOREAN JOURNAL OF METALS AND MATERIALS-
dc.identifier.doi10.3365/KJMM.2011.49.4.334-
dc.contributor.localauthorLee, Won-Jong-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorelectrical/electronic materials-
dc.subject.keywordAuthorvapor deposition-
dc.subject.keywordAuthorsurface-
dc.subject.keywordAuthorcomputer simulation-
dc.subject.keywordAuthorCu CECVD-
dc.subject.keywordPlus3-DIMENSIONAL CHIP STACKING-
dc.subject.keywordPlusCU-
dc.subject.keywordPlusTECHNOLOGY-
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