Browse "CS-Conference Papers(학술회의논문)" by Author Lee, Woojin

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Towards a Formal Framework for Product Line Test Development

Kang, Sungwon; Lee, Jihyun; Kim, Myungchul; Lee, Woojin, CIT 2007: 7th IEEE International Conference on Computer and Information Technology, pp.921 - 926, IEEE, 2007-10-16

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