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Showing results 34161 to 34180 of 279407
| ATOMIC AND ELECTRONIC-STRUCTURE AND CHEMICAL-REACTIVITY OF METAL-CLUSTERS BOUDART, M; SAMANT, MG; Ryoo, Ryong, ULTRAMICROSCOPY, v.20, no.1-2, pp.125 - 133, 1986 |
| Atomic and molecular stabilization in two-frequency laser fields Datta, A; Bhattacharyya, SS; Lee, S; Kim, Bongsoo, JOURNAL OF CHEMICAL PHYSICS, v.119, no.4, pp.2083 - 2087, 2003-07 |
| Atomic arrangement and formation mechanism of c-axis oriented ZnO thin films grown on p-Si substrates Park, NK; Lee, HS; No, YS; Kim, TW; Lee, Jeong Yong; Choi, WK, IUMRS International Conference in Asia 2006, IUMRS-ICA 2006, v.124-126, no.PART 1, pp.93 - 96, 2006-09-10 |
| Atomic arrangement and formation mechanism of c-axis oriented ZnO thin films grown on p-Si substrates Park, N.K.; Lee, H.S.; No, Y.S.; Kim, T.W.; Lee, JeongYong; Choi, W.K., DIFFUSION AND DEFECT DATA PT.B: SOLID STATE PHENOMENA, v.124-126, no.PART 1, pp.93 - 96, 2007-05 |
| Atomic arrangement variations of 30 degrees in-plane rotation domain boundaries in ZnO thin films grown on Si substrates due to thermal annealing Shin, JW; Lee, JeongYong; No, YS; Kim, TW; Choi, WK, JOURNAL OF MATERIALS RESEARCH, v.24, pp.2006 - 2010, 2009-06 |
| Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment Shin, JW; Lee, JeongYong; No, YS; Jung, JH; Kim, TW; Choi, WK, APPLIED PHYSICS LETTERS, v.90, no.18, 2007-04 |
| Atomic arrangements and formation mechanisms of the CuPt-type ordered structure in CdxZn1-xTe epilayers grown on GaAs substrates Kim, TW; Lee, DU; Choo, DC; Lee, HS; Lee, JeongYong; Park, HL, APPLIED PHYSICS LETTERS, v.78, no.7, pp.922 - 924, 2001-02 |
| Atomic arrangements of (Ga(1-x)Mn(x))N nanorods grown on Al(2)O(3) substrates Lee, Kyu Hyung; Lee, JeongYong; Jung, J. H.; Kim, T. W.; Jeon, H. C.; Kang, T. W., APPLIED PHYSICS LETTERS, v.92, no.14, 2008-04 |
| Atomic arrangements of a CuAu-I type ordered structure in strained InxGa1-xAs/InyAl1-yAs multiple quantum wells Lee, DU; Jin, JY; Yun, TY; Kim, TW; Lee, HS; Kwon, MS; Lee, JeongYong, JOURNAL OF MATERIALS SCIENCE, v.40, pp.3843 - 3846, 2005-07 |
| Atomic Arrangements of Asymmetrically-tilted Grain Boundaries in 30 degrees Rotation Domains of ZnO Thin Films Grown on n-Si Substrates Yuk, Jong Min; No, Y.S.; Kim, T.W.; Kim, J.Y.; Choi, W.K., JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.55, no.1, pp.246 - 249, 2009 |
| Atomic Chirality and a Materials Revolution Yeom, Jihyeon, ACCOUNTS OF MATERIALS RESEARCH, v.2, no.7, pp.471 - 476, 2021-07 |
| Atomic Commitment in Multidatabase Systems Yoo, H.D.; Kim, Myoung Ho, Seventh Int'l Conf. on Parallel and Distributed Computing Systems, pp.700 - 705, Seventh Int'l Conf. on Parallel and Distributed Computing Systems, 1994-10 |
| Atomic configuration model with emitting dislocations in the ${α_2}$ /γ by ${α_2}$ to γ phase transformation during creep deformation in the lamellar TiAl alloy = Lamellar TiAl 합금의 크리프시 ${α_2}$ 에서 γ로의 상변태와 계면에서의 방출전위를 위한 원자 단위의 모델링link Jung, He-Jin; 정혜진; et al, 한국과학기술원, 2003 |
| Atomic cranks and levers control sugar ring conformations Zhang, Qingmin; Lee, Gwangrog; Marszalek, Piotr E., JOURNAL OF PHYSICS-CONDENSED MATTER, v.17, no.18, pp.S1427 - S1442, 2005-05 |
| Atomic crystal structure of ordered In3Sb1Te2 ternary alloy studied by high-resolution transmission electron microscopy Kim, Chung-Soo; Lee, Jeong-Yong; Kim, Yong-Tae, APPLIED PHYSICS LETTERS, v.100, no.15, 2012-04 |
Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide Peng, Zirong; Rohwerder, Michael; Choi, Pyuck-Pa; Gault, Baptiste; Meiners, Thorsten; Friedrichs, Marcel; Kreilkamp, Holger; et al, CORROSION SCIENCE, v.120, pp.1 - 13, 2017-05 |
| Atomic dipole approximation for quantum plasmon simulation of nanoparticles 임재창; 김재욱; 김우연; Ryu, Seol, 120th KCS General Meeting & Exhibition, 대한화학회, 2017-10-20 |
| Atomic electron tomography in three and four dimensions Zhou Jihan; Yang, Yongsoo; Ercius, Peter; Miao Jianwei, MRS BULLETIN, v.45, no.4, pp.290 - 297, 2020-04 |
| Atomic Force Acoustic Microscopy to Measure Nanoscale Mechanical Properties of Cement Pastes Kim, Jae Hong; Balogun, Oluwaseyi; Shah, Surendra P., TRANSPORTATION RESEARCH RECORD, no.2141, pp.102 - 108, 2010-01 |
| Atomic force microscope probe tips using heavily boron-doped silicon cantilevers realized in a (110) bulk silicon wafer Cho, Il-Joo; Park, Eun-Chul; Hong, Songcheol; Yoon, Euisik, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.12B, pp.7103 - 7107, 2000-12 |
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