Browse by Subject 1/f noise
Showing results 18 to 20 of 20
| Significance of gate oxide thinning below 1.5 nm on 1/f noise behavior in n-channel metal-oxide-semiconductor field-effect transistors under electrical stress Mheen, B; Kim, M; Song, YJ; Hong, Songcheol, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.6A, pp.4943 - 4947, 2006-06 |
| Sputtering pressure dependent bolometric properties of Ni1-xO thin films for uncooled bolometer applications Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9498 - 9504, 2017-08 |
| 적외선 센서의 볼로미터 저항체로 사용된 다결정 실리콘 박막에 발생하는 TCR 및 1/f Noise의 최적화 방법에 관한 연구 = A research on how to optimize the level of the TCR and 1/f noise which occur in the polycrystalline silicon film used as a bolometer resistorlink 양진영; Yang, Jin-Young; et al, 한국과학기술원, 2006 |
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