Showing results 1 to 3 of 3
Accelerated Life Tests for Products of Unequal Size Bai, Do Sun; h.j. yun, IEEE TRANSACTIONS ON RELIABILITY, v.45, no.4, pp.611 - 618, 1996 |
Comparisons of optimal accelerated test plans for estimating quantiles of lifetime distribution at the use condition Park, JI; Yum, Bong-Jin, ENGINEERING OPTIMIZATION, v.31, no.3, pp.301 - 328, 1999 |
Time-Censored Ramp Test with Stress Bound for Weibull Lifetime Distribution Bai, Do Sun; y. r. chun; m.s. cha, IEEE TRANSACTIONS ON RELIABILITY, v.46, no.1, pp.99 - 107, 1997 |
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