Time-Censored Ramp Test with Stress Bound for Weibull Lifetime Distribution

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This paper considers ramp tests for Weibull life distribution when there are limitations on test stress and test time. The inverse power law and a cumulative exposure model are assumed. Maximum likelihood estimators of model parameters and their asymptotic covariance matrix are shown. The optimum ramp test plans are given which minimize the asymptotic variance of the ML estimator of a specified quantile of log(life) at design constant stress. The effects of the pre-estimates of design parameters are studied.
Publisher
IEEE-Inst Electrical Electronics Engineers Inc
Issue Date
1997
Language
English
Article Type
Article
Keywords

VOLTAGE; STEP

Citation

IEEE TRANSACTIONS ON RELIABILITY, v.46, no.1, pp.99 - 107

ISSN
0018-9529
URI
http://hdl.handle.net/10203/69628
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