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Showing results 196441 to 196460 of 279418
| Test of Langmuir Probes Developed for the CubeSat LINK Na, Go Woon; Yang, Jongmann; Ryu, Kwangsun; Lee, Jun Chan; Min, Kyoung Wook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.68, no.3, pp.482 - 485, 2016-02 |
| TEST OF MEAN-FIELD BEHAVIOR BY LIGHT-SCATTERING IN 3 PHASES OF A FLUID MIXTURE NEAR ITS TRICRITICAL POINT Kim, Mahn-Won; GOLDBURG, WI; ESFANDIARI, P; SENGERS, JMHL, JOURNAL OF CHEMICAL PHYSICS, v.71, no.12, pp.4888 - 4898, 1979 |
| Test of prototype ITER vacuum ultraviolet spectrometer and its application to impurity study in KSTAR plasmas Seon, C. R.; Hong, J. H.; Jang, Juhyeok; Lee, S. H.; Choe, Won-Ho; Lee, H. H.; Cheon, M. S.; et al, REVIEW OF SCIENTIFIC INSTRUMENTS, v.85, no.11, 2014-11 |
| TEST OF SINGLE REFLECTIVE GRATING BASED FIBER OPTIC SENSOR DESIGN FOR MEASUREMENT OF TILT ANGLE Lee, Yeon-Gwan; Jang, Byeong-Wook; Kim, Yoon Young; Kim, DH; Kim, Chun-Gon, 18th International Conference on Composite Materials (ICCM), The Korean Society for Composite Materials, 2011-08-23 |
| TEST OF THE ASSUMPTION OF THE SCALING LAW FOR POLYMER MONOLAYERS Kim, Mahn-Won; LIU, SN; CHUNG, TC, PHYSICAL REVIEW LETTERS, v.60, no.26, pp.2745 - 2748, 1988-06 |
| Test of the rational expectations hypothesis in Korea - determinants of real GNP fluctuations in Korea Min, Hong Ghi; McDonald, Judy, Journal of East and West Studies (Currently known as Global Economic Review), v.19, no.1, pp.69 - 83, 1990 |
| Test Particle Diffusion in Tokamak in the Presence of Electromagnetic Fluctuations and Collisions 최덕인, 한국물리학회, 1988 |
| Test Particle Simulations for Transport in Toroidal Plasmas Hyoung-Bin Park; Eun-Gi Heo; Wendell Horton; Choi, Duk In, PHYSICS OF PLASMAS, v.4, no.9, pp.3273 - 3281, 1997 |
| Test particle simulations for transport in toroidal plasmas = 토로이달 플라즈마의 수송에 대한 시험입자 시늉내기link Park, Hyoung-Bin; 박형빈; Choi, Duk-In; Jin, Gyo-Tag; et al, 한국과학기술원, 1998 |
| Test Particle Simulations in a Tokamak Choi, Duk In, Asia Pacific Plasma Theory Conference, 1997 |
| Test pattern clustering for fast and accurate lithography modeling = 빠르고 정확한 리소그래피 모델링을 위한 테스트 패턴 클러스터링link Cho, Gangmin; Shin, Youngsoo; et al, 한국과학기술원, 2021 |
| Test pattern extraction for lithography modeling under design rule revisions Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
| Test Pattern Generation for the Functional Test of Logic Networks hong, w.m.; Cho, Jung Wan, JOURNAL OF KIEE, v.13, no.3, pp.1 - 6, 1976-07 |
| Test Pattern Generation of Combinational Circuits using Logic Decision Diagrams Lim, Jong-Tae; Lee, MS, ISIM 2000, pp.375 - 378, 2000-10 |
| Test Sequence Generation for Adaptive Interoperability Testing Kang, Sungwon; Kim, Myungchul, IFIP TC6/WG6.1 The 8th International Workshop on Protocol Test Systems (IWPTS'95), pp.193 - 206, 1995-09 |
| Test sequence generation from modechart specification = Modechart 명세 기반의 실시간 시스템 테스트 시퀀스 생성link Lee, Nam-Hee; 이남희; et al, 한국과학기술원, 1998 |
| Test sequence generation from specification in system description language = 시스템 기술 언어로 된 규격으로 부터의 시험 계열 생성 기법link Chin, Byoung-Moon; 진병문; et al, 한국과학기술원, 1996 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| Test statistics of composite-signal detectors in purely-additive noise Son,Jae Cheol; Song, lickho; Park Yang Soo; Kim, Ji Hoon; Chang Jae Joo, KITE JOURNAL OF ELECTRONICS ENGINEERING, v.1, no.1, pp.1 - 5, 1990-04 |
| Test Time Elongation of the Shock Tube Using Driver Gas Staging Valve Kim, Keunyeong; Jeong, Junho; PARK, GISU, The 34th International Symposium on Shock Waves, National Symposium on Shock Waves Korea, 2023-07-17 |
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- 62 1964 - 1969