Browse by Subject spectroscopy and imaging

Showing results 1 to 4 of 4

1
Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device

Lee, Jongmin; Kim, Jung-Hwa; Park, Sungbin; You, Yong Sung; Lee, Jae-seok; Ghim, Young-chul; Hwang, Y. S., JOURNAL OF INSTRUMENTATION, v.18, no.12, 2023-12

2
Estimation of reliable range of electron temperature measurements with sets of given optical bandpass filters for KSTAR Thomson scattering system based on synthetic Thomson data

Kim, K. -H.; Oh, T. -S.; Park, K. -R.; Lee, J. H.; Ghim, Young-chul, JOURNAL OF INSTRUMENTATION, v.12, 2017-11

3
Extreme UV spectrometers for the tungsten 40-70 angstrom emission in the WEST tokamak

Guirlet, R.; Song, I; Moureau, G.; Batal, T.; Schwob, J. L.; Seon, C.; Desgranges, C.; et al, JOURNAL OF INSTRUMENTATION, v.14, no.10, 2019-10

4
Interferogram analysis of X-pinch plasmas with a synthetic dark-field Schlieren image

Bong, Seungmin; Lee, Dong-Geun; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Lee, Jongmin; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11

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