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A 3-D X-ray microtomographic system with a CMOS image sensor Lee, SW; Kim, HK; Cho, Gyuseong; Shin, YH; Won, YY, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.48, no.4, pp.1505 - 2, 2001-08 |
Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners Jang, Sun Young; Kim, Ho Kyung; Youn, Hanbean; Cho, Seungryong; Cunningham, Ian A., IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, v.64, no.1, pp.173 - 183, 2017-01 |
Use of a flat-panel detector for microtomography: A feasibility study for small-animal imaging Kim, HK; Lee, SC; Cho, MH; Lee, SY; Cho, Gyuseong, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.52, no.1, pp.193 - 198, 2005-02 |
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