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Showing results 1 to 7 of 7

1
Characterization of current injection mechanism in Schottky-barrier metal-oxide-semiconductor field-effect transistors

Choi, Sung-Jin; Han, Jin-Woo; Jang, Moon-Gyu; Choi, Chel-Jong; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.95, no.8, 2009-08

2
Consideration of the leakage-current and the radiation-response characteristics of silicon PIN detectors with different N-type substrates and their application to a personal gamma-ray dosimeter

Park, Jong-Moon; Park, Kun-Sik; Yoon, Yong-Sun; Koo, Jin-Gun; Kim, Bo-Woo; Chae, Hyun-Sic; No, Kwang-Soo; et al, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.51, pp.10 - 17, 2007-07

3
Electronic structures of oxygen-deficient Ta2O5

Yang, Yong; Nahm, Ho-Hyun; Sugino, Osamu; Ohno, Takahisa, AIP ADVANCES, v.3, no.4, 2013-04

4
Fabrication of Polycrystalline Si Films by Vapor-Induced Crystallization and Rapid Thermal Annealing Process

Yang, Yong-Ho; Ahn, Kyung-Min; Ahn, Byung-Tae, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.13, no.8, pp.92 - 95, 2010

5
HfO2/HfOxNy/HfO2 Gate Dielectric Fabricated by In Situ Oxidation of Plasma-Enhanced Atomic Layer Deposition HfN Middle Layer

Maeng, W. J.; Gu, Gil Ho; Park, C. G.; Lee, Kayoung; Lee, Taeyoon; Kim, Hyungjun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.156, no.8, pp.G109 - G113, 2009

6
High Stability InGaZnO4 Thin-Film Transistors Using Sputter-Deposited PMMA Gate Insulators and PMMA Passivation Layers

Kim, Dong-Hun; Choi, Seung-Hoon; Cho, Nam-Gyu; Chang, Young-Eun; Kim, Ho-Gi; Hong, Jae-Min; Kim, Il-Doo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.12, no.8, pp.296 - 298, 2009

7
Structural and compositional dependence of gadolinium-aluminum oxide for the application of charge-trap-type nonvolatile memory devices

Park, Young-Min; Park, Jong-Kyung; Song, Myeong-Ho; Lim, Sung-Kyu; Oh, Jae-Sub; Joo, Moon-Sig; Hong, Kwon; et al, APPLIED PHYSICS LETTERS, v.96, no.5, 2010-02

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