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Showing results 1 to 4 of 4

1
Effects of gate bias stress on the electrical characteristics of ZnO thin film transistor

Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Shin, Jae-Heon; Hwang, Chi-Sun; Park, Sang-Hee Ko; Seo, Jong-Hyun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.1, pp.412 - 415, 2008-07

2
Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors

Cheong, Woo-Seok; Lee, Jeong-Min; Yoon, Sung Min; Lee, Jong-Ho; Yang, Shinhyuk; Chung, Sung Mook; Cho, Kyoung Ik; et al, ETRI JOURNAL, v.31, no.6, pp.660 - 666, 2009-12

3
Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study

Gupta, Dipti; Yoo, Seunghyup; Lee, Changhee; Hong, Yongtaek, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.7, pp.1995 - 2002, 2011-07

4
Improved electrical stability and UV emission of zinc oxide thin films prepared by combination of metalorganic chemical vapor deposition technique and post-deposition hydrogen doping

Myong, SY; Lim, Koeng Su, ORGANIC ELECTRONICS, v.8, pp.51 - 56, 2007-02

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